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AS6081 standard
Test/InspectionMinimum Sample SizeLevel

Lot Size 200 or greaterDevicesLot Size 1-199 Devices(See NOTE 1)
Minimum Required Tests

Level A
Documentation and Packaging

A1
Documentation and Packaging Inspection (4.2.6.4.1) (non-destructive)All devicesAll devices
External Visual Inspection

A2
a. General (4.2.6.4.2.1) (non-destructive)All devicesAll devices
b. Detailed (4.2.6.4.2.2) (non-destructive)122 devices122 or all devices, whichever is less
Remarking & Resurfacing (destructive)See NOTE 2See NOTE 2A3
Solvent Test for Remarking (4.2.6.4.3 A) (destructive)3 devices3 devices
Solvent Test for Resurfacing (4.2.6.4.3 B) (destructive)3 devices3 devices
Radiological (X-Ray) Inspection

A4
X-Ray Inspection (4.2.6.4.4) (non-destructive)45 devices45 devices or all devices,whichever is less
Lead Finish Evaluation (XRF or EDS/EDX)See NOTE 3See NOTE 3A5
XRF (non-destructive) or EDS/EDX (destructive) (4.2.6.4.5)(Appendix C.1)3 devices3 devices
Delid/Decapsulation Internal Analysis (destructive)See NOTE 4See NOTE 4A6
Delid/Decapsulation (4.2.6.4.6) (destructive)3 devices3 devices
Additional Tests (as agreed between Customer and Organization)


Remarking & Resurfacing (destructive)See NOTE 2See NOTE 2A3 Option
Scanning Electron Microscope (4.2.6.4.3 C) (destructive)3 devices3 devices
Quantitative Surface Analysis (4.2.6.4.3 D) (non-destructive)5 devices5 devices
Thermal Testing

Level B
Thermal Cycling Test (Appendix C.2)All devicesAll devices
Electrical Testing

Level C
Electrical Testing (Appendix C.3)116 devicesAll devices
Burn-In

Level D
Burn-In (Pre & Post) (Appendix C.4)45 Devices45 devices or all devices,whichever is less
Hermeticity Verification (Fine and Gross Leak)

Level E
Hermeticity Verification (Fine and Gross Leak) (Appendix C.5)All devicesAll devices
Scanning Acoustic Microscopy (SAM)

Level F
Scanning Acoustic Microscopy (SAM) (Appendix C.6)As specifiedAs specified
Other

Level G
Other test/inspectionsAs specifiedAs specified

NOTES:

1. For very small lot sizes, less than ten (10) devices, this “destruct” test sample size may be reduced to one (1) device at the discretion of the Cognizant Engineer with Quality Assurance concurrence and Customer approval.

2. Devices for the Remarking & Resurfacing Inspection shall be selected from the Detailed External Visual Inspection lot.

3. Devices with possible lead finish anomalies shall be selected from the Detailed External Visual Inspection lot.

4. Devices for the Delid/Decapsulation Internal Analysis shall be selected from the Remarking & Resurfacing Inspection lot.


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