Testing Lab
Weixin Service CXOLab CHUANGXIN ONLINE TESTING LAB
Weixin Vedio CXOLab CHUANGXIN ONLINE TESTING LAB
DouYin CHUANGXIN ONLINE TESTING LAB
KuaiShou CHUANGXIN ONLINE TESTING LAB
Electrical and Temperature Testing

Digital integrated circuits:

  • Delay measurements: MIL-STD-883K-2017 3003.1

  • Transition time measurements: MIL-STD-883K-2017 3004.1

  • Power supply current: MIL-STD-883K-2017 3005.1

  • High level output voltage: MIL-STD-883K-2017 3006.1

  • Low level output voltage: MIL-STD-883K-2017 3007.1

  • Input current, low level: MIL-STD-883K-2017 3009.1

  • Input current, high level: MIL-STD-883K-2017 3010.1

Diode

  • Forward voltage: Semiconductor discrete device testing measurement GJB 128A-1997/method 4011

  • Reverse current: Semiconductor discrete device testing measurement GJB 128A-1997/method 4016

Measuring methods for semiconductor photocouplers

  • Forward voltage drop: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.1

  • Reverse Leakage Current: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.3

  • Reverse breakdown current: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.4

  • Input current, high level: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.14

  • Input current, low level: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.15

  • current transfer ratio: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.9

Resistors

Standards: Test methods for electronic and electrical component parts GJB360B-2009 method 303

Capacitors

Standards: Test methods for electronic and electrical component parts GJB360B-2009 method 305

Inductors

Standards: Fixed inductors for use in electronic equipment Part 2: sectional specification surface mounting inductors

Potentiometers

General specification for precision wire wound potentiometers GJB1523-1992

Semiconductors integrated circuits voltage regulators

Semiconductor integrated circuits--Measuring method of voltage regulator:GB/T 4377-2018

Electromagnetic relays

  • DC resistance of a coil: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.1

  • Pull-in voltage: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.3.1

  • Dropout voltage: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.3.4

Semiconductors-Transistor

Semiconductor discrete devices and integrated circuit Part 7: Bipolar Transistors GB/T 4587-1994

FET(Field Effected Transistor)

Semiconductor discrete devices and integrated circuit Part 8: Field-effect transistors GB/T 4586-1994


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