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Electrical and Temperature Testing

Digital integrated circuits:

  • Delay measurements: MIL-STD-883K-2017 3003.1

  • Transition time measurements: MIL-STD-883K-2017 3004.1

  • Power supply current: MIL-STD-883K-2017 3005.1

  • High level output voltage: MIL-STD-883K-2017 3006.1

  • Low level output voltage: MIL-STD-883K-2017 3007.1

  • Input current, low level: MIL-STD-883K-2017 3009.1

  • Input current, high level: MIL-STD-883K-2017 3010.1

Diode

  • Forward voltage: Semiconductor discrete device testing measurement GJB 128A-1997/method 4011

  • Reverse current: Semiconductor discrete device testing measurement GJB 128A-1997/method 4016

Measuring methods for semiconductor photocouplers

  • Forward voltage drop: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.1

  • Reverse Leakage Current: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.3

  • Reverse breakdown current: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.4

  • Input current, high level: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.14

  • Input current, low level: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.15

  • current transfer ratio: Measuring methods for semiconductor photocouplers SJ/T 2215-2015 /5.9

Resistors

Standards: Test methods for electronic and electrical component parts GJB360B-2009 method 303

Capacitors

Standards: Test methods for electronic and electrical component parts GJB360B-2009 method 305

Inductors

Standards: Fixed inductors for use in electronic equipment Part 2: sectional specification surface mounting inductors

Potentiometers

General specification for precision wire wound potentiometers GJB1523-1992

Semiconductors integrated circuits voltage regulators

Semiconductor integrated circuits--Measuring method of voltage regulator:GB/T 4377-2018

Electromagnetic relays

  • DC resistance of a coil: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.1

  • Pull-in voltage: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.3.1

  • Dropout voltage: General specification for electromagnetic relays GJB 1042A-2002 4.6.8.3.4

Semiconductors-Transistor

Semiconductor discrete devices and integrated circuit Part 7: Bipolar Transistors GB/T 4587-1994

FET(Field Effected Transistor)

Semiconductor discrete devices and integrated circuit Part 8: Field-effect transistors GB/T 4586-1994


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