ATM90E36A-AU Failure analysis Report

Date：2025-12-08 11:44:24 Views：316 Author：创芯在线检测中心

Part Number:ATM90E36A-AU

Test results

External visual inspection results：

External visual inspection was verified of 2 samples (F1,F2).Cracks and Secondary coatings were found on the sample (F1) surface.Secondary coatings were found on the sample (F2) surface.

Electrical Characteristics results：

Three samples (G1,F1,F2) were tested, and compared with good G1 products, Pin36-Pin2(GND) of F1 samples was found open current,pin36-Pin2(GND) of F2 samples was found open current.

Internal visual inspection results：

After opening the lid of sample (F1,G1), internal visual examination was carried out, and crack was found on the surface of Die,G1was no obvious anomaly.

analysis of conclusion

Based on the analysis of the test results, The chip was a secondary coating. The chip was subjected to thermal stress caused by the continuous high temperature of EOS, which led to breakdown and the formation of cracks, resulting in functional abnormalities.