Semiconductor reliability testing and testing methods

Date：2024-01-31 11:09:42 Views：263

Semiconductors are an important component of electronic devices, and their reliability is crucial for the performance and lifespan of the equipment. To ensure the reliability of semiconductors, it is necessary to conduct reliability testing and use corresponding detection methods for verification. There are numerous semiconductor reliability testing projects and various testing methods, including high and low temperature testing, thermal resistance testing, mechanical impact testing, and lead bonding strength testing. This article will introduce semiconductor reliability testing projects and common detection methods.

Semiconductor reliability testing project:

1. Appearance inspection

2. High temperature reverse bias voltage

3. High temperature gate bias voltage

4. Thermal shock

5. Vibration

6. Mechanical impact

7. Non biased high acceleration stress test

8. High pressure vessel test

9. High acceleration stress test

10. High temperature and high humidity reverse bias voltage

11. High temperature storage

12. Low temperature storage

13. Insulation testing

14. Power cycle

15. EDS characteristics

16. Destructive Physical Analysis

17. Welding thermal durability

18. Thermal resistance

19. Lead bonding strength

20. Dielectric strength test

Semiconductor testing methods:

1. Appearance inspection

It is necessary to check the flatness, color, mirror finish, etc. of the semiconductor to ensure that there are no appearance defects and do not affect the subsequent testing steps. The main purpose is to evaluate the appearance quality of the semiconductor.

2. Temperature lower limit working test

The tested product is first powered up and tested using the testing program for initial testing. Under the condition that the test item is not working, gradually reduce the temperature inside the box to 0 ℃. After the temperature stabilizes, power on and run the test program for 5 hours to check whether the function and operation of the test item are normal. After the test is completed, wait for the temperature of the box to return to room temperature, remove the test sample, and restore it to normal atmospheric pressure for 2 hours.

3. Temperature upper limit working test

First, conduct a preliminary test on the test sample. When the test sample is not working, gradually increase the box temperature to 40 ℃. After the temperature stabilizes, power on and run the system diagnostic program for 5 hours to check if its function and operation are normal. After the test is completed, wait until the box temperature returns to room temperature, remove the test sample, and restore it to normal atmospheric pressure for 2 hours.

4. Electrical performance testing

Evaluate the electrical performance of semiconductors by measuring their conductivity, resistivity, current, and voltage characteristics, and test their performance under normal working conditions.

5. Low temperature storage test

Put the test item into a low-temperature box, reduce the temperature inside to -20 ℃, and store it for 16 hours when the test item is not working. Take out the test item and return it to room temperature, then recover for 2 hours. Power on and run the test program to check if it operates normally and if there is any obvious deviation in appearance. To prevent frosting and condensation of the test substance during the experiment, the test substance can be sealed with polyethylene film and tested. If necessary, moisture absorbent can also be installed inside the sealing sleeve.

6. High temperature storage

Put the test item into a high-temperature box, raise the temperature to 55 ℃, store it for 16 hours when the test item is not working, take it out and return to room temperature, recover for 2 hours, and check if it is normal.

The above is the content related to semiconductor reliability testing and testing methods compiled by Chuangxin Testing. We hope it will be helpful to you. Chuangxin Testing is a professional testing institution for electronic components, currently mainly providing integrated circuit testing services such as capacitors, resistors, connectors, MCU, CPLD, FPGA, DSP, etc. Specializing in functional testing of electronic components, appearance testing of incoming electronic components, anatomical testing of electronic components, acetone testing, X-ray scanning testing of electronic components, and ROHS component analysis testing. Welcome to call, we will be happy to serve you!