Login | Join Free



Screening and testing items for semiconductor discrete device diodes

Date:2024-05-13 17:18:11 Views:91

The failure of electronic components is mostly caused by various physical and chemical changes inside and on the surface, and whether it is military or civilian products, screening is an important means to ensure reliability. This article will explore the screening testing projects for semiconductor discrete device diodes, aiming to gain a deeper understanding of the importance of these testing projects and their impact on product performance. By conducting precise screening tests, the consistency and reliability of diodes can be ensured, providing a stable foundation for the normal operation of electronic devices.

Semiconductor discrete device diode screening test standard

1. GJB128A-97 Test Methods for Semiconductor Discrete Devices

2. MIL-STD-750D Semiconductor Discrete Device Test Methods Semiconductor Discrete Device Diode Screening Test Items

1. High temperature storage: Germanium tube at 100 ℃, silicon tube at 150 ℃, 96 hours.

2. Temperature cycle: Germanium tube -55 ℃ -85 ℃, 5 times; Silicon tube -55 ℃~125 ℃, 5 times.

3. Knocking: Use a hard rubber hammer to knock 3-5 times, while monitoring the positive characteristic curve with a graph instrument.

4. Drop: At a height of 80 cm, press the free fall onto the glass plate 5-15 times.


5. Power aging:

① Switch tube: 1. 5 times rated forward current, 12 hours;

② Voltage regulator: 1 to 1. 5 times rated power, 12 hours;

③ Detection rectifier tube: 1 to 1. 5 times rated current, 12 hours;

④ Double base diode: rated power aged for 12 hours.

6. High temperature reverse bias: Germanium tube 700C, silicon tube 1250C, rated reverse voltage for 2 hours, leakage current not exceeding specification value.

7. High temperature test: Germanium tube at 70 ℃, silicon tube at 125 ℃.

8. Low temperature test: -55 ℃.

9. Appearance inspection: Use a microscope or magnifying glass to inspect the appearance quality and remove defective pipes such as broken glass. The purpose of electronic component screening is to ensure the reliability of components, select components with good internal structural quality, good welding quality of various types of solder joints, and no layering in packaging,

2. Identify and eliminate defects and hazards in manufacturing, process, and materials

3. Distinguish between components and repaired products, imitations, performance good products and defective products;

4. Expose potential unsafe factors during use to avoid causing greater losses. Why choose? 1. Based on customer product specifications, accurately develop screening plans and regulations for components.

2. Based on the screening results, accurately locate the mechanism of component failure and provide a component failure analysis plan according to customer needs.

3. Military level testing system control, ensuring testing process and accuracy, third-party impartial testing institutions.

4. One stop testing service for components: DPA testing, AEC-Q100, AEC-Q200, failure analysis and other testing capabilities.

Since the establishment of the laboratory in 2007, the company has focused on the research and development of component testing, standard formulation, equipment upgrading, component data analysis and process improvement, and supply chain management.

Chuangxin Testing always adheres to the principle of "professionalism, authority, efficiency, and innovation", and has purchased international advanced testing equipment with a heavy investment. The testing strictly follows international testing standards and methods, and is recognized by the China National Accreditation Service (CNAS) and the Guangdong Provincial Administration for Market Regulation (CMA). The testing reports issued by Chuangxin Testing have international mutual recognition effect, and can be recognized by 70 laboratory accreditation institutions in 58 countries around the world. Welcome to call, we will be happy to serve you!