How to select appropriate test items for "reliability test" electronic components?

Date：2021-10-18 15:44:12 Views：1550

With the continuous development of electronic and electrical products, their varieties are more and more complex and comprehensive, and China's provisions on the testing standards of electronic components are also relatively standardized. Reliability test is very important for the durability of products. For example, the reliability test of temperature and humidity can reflect the state of electronic products under extreme high and low temperatures. This test of temperature and humidity can test the impact of climate on electronic products. How to choose suitable component testing items without detours? Next, let's introduce the testing items of electronic products.

Specific inspection items of electronic and electrical products:

Electromagnetic compatibility testing: radiation disturbance, conduction disturbance, electrostatic discharge, harmonic current, ringing wave immunity, voltage change, voltage fluctuation, electrostatic discharge immunity, magnetic induction current radiation, RF electromagnetic field radiation immunity, electrical fast transient pulse group immunity, surge (impact) immunity, RF field induced conduction disturbance immunity, voltage sag Immunity to short-time interruption and voltage change, power frequency magnetic field immunity.

Optical, electrical and thermal performance and interface test: temperature rise test and heat distribution, etc.

Safety regulation test: electrical parameters, dielectric strength, insulation resistance, leakage current, anti electric shock structure inspection, grounding regulations and on resistance, creepage distance and electrical clearance, ball voltage test and temperature rise test.

Material identification and lighting engineering acceptance: identification of LED lamp light source packaging, chip, power supply and controller. Indoor and outdoor lighting brightness and illuminance test and simulation; Test, analysis and evaluation of indoor illuminance and daylighting of buildings.

Focus on the reliability test. What reliability test items need to be carried out in most cases of electronic components? Let's take a look.

Mechanical integrity test items

1. Mechanical shock: determine whether optoelectronic devices can be used in electronic equipment subject to medium severity shock. The impact may be caused by sudden stress or violent vibration during loading, unloading, transportation or on-site use.

2. Variable frequency vibration: determine the impact of vibration on various components of optoelectronic devices within the specified frequency range.

3. Thermal shock: determine the resistance and effect of optoelectronic devices when subjected to temperature upheaval

4. Plug in durability: determine whether the optical power, loss, reflection and other parameters of optical fiber connector of optoelectronic devices meet the repeatability requirements.

5. Storage test: determine whether optoelectronic devices can withstand high temperature and low temperature transportation and storage.

6. Temperature cycle: determine the ability of optoelectronic devices to withstand extremely high temperature and extremely low temperature, and the impact of alternating changes of extremely high temperature and extremely low temperature on optoelectronic devices.

7. Constant damp heat: determine whether sealed and unsealed optoelectronic devices can withstand the specified temperature and humidity at the same time.

8. High temperature life: determine the high temperature accelerated aging failure mechanism and working life of optoelectronic devices.

Accelerated aging test

High temperature, high humidity and certain driving current are applied to optoelectronic devices to accelerate aging. According to the test results, the optoelectronic devices are judged to have function and loss of function, as well as acceptance and rejection, and the working conditions of optoelectronic devices can be adjusted and the reliability can be calculated.

1. High temperature accelerated aging: it is a very basic environmental stress high temperature in the process of accelerated aging. During the experiment, the selected parameters shall be monitored regularly until the degradation exceeds the end of life.

2. Constant temperature test: the constant temperature test is similar to the high-temperature operation test. The number of samples and allowable failure number of constant temperature test shall be specified.

3. Variable temperature test: the high temperature accelerated aging test with variable temperature is to increase the temperature regularly and gradually in sequence (for example, 60 ℃, 85 ℃ and 100 ℃)

4. Temperature cycling: in addition to the temperature cycling of optoelectronic devices as an environmental stress test, temperature cycling can also accelerate the aging of tube electronic devices. The accelerated aging of temperature cycle is generally not to cause the degradation of specific performance parameters, but to provide additional instructions on the long-term mechanical stability of the optical path encapsulated in the component.

Physical property test items

1. Internal water vapor: determine the water vapor content in the gas inside the optoelectronic device encapsulated in metal or ceramic.

2. Tightness: determine the air tightness of optoelectronic device package with inner cavity.

3. ESD value: determine the sensitivity and sensitivity of optoelectronic devices to damage and degradation caused by electrostatic discharge.

4. Flammability: determine the flammability of materials used in optoelectronic devices.

5. Shear force: determine the integrity of materials and processes used by chips and passive components of optoelectronic devices installed on sockets or other substrates.

6. Solderability: determine the solderability of optoelectronic device leads (leads with diameter less than 30175mm and flat leads with equivalent cross-sectional area).

7. Wire bonding strength: determine the wire bonding strength of optoelectronic devices using low temperature welding, hot pressing welding, ultrasonic welding and other technologies.

The above is the related content of "reliability of electronic components" brought by the core creation test. I hope it can be helpful to you. We will bring more wonderful content in the later stage. The company's testing services cover: electronic component testing and verification, IC authenticity identification, product design and material selection, failure analysis, function testing, factory incoming material inspection, tape braiding and other testing items. Welcome to call Chuangxin testing, we will serve you wholeheartedly.