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- · Common testing methods and experiences for electronic components
- · About IC: Introduction to Infrastructure Diodes and Discrete and Integrated Circuits
- · The purpose of oblique impact testing for electronic components
- · The importance of connector insertion and extraction force testing
- · Test methods and items for secondary screening of electronic components
- · AEC-Q100-002E:2013 Human Body Model (HBM) Electrostatic Discharge(ESD) Test - 完整英文电子版(7页)
- · AEC-Q100-001C: 1998 WIRE BOND SHEAR TEST - Complete English Electronic Version (14 pages)
- · Application Explanation of CNAS-CL01-A003 Testing and Calibration Laboratory Capability Accreditation Criteria in the Field of Electrical Testing
- · AEC-Q100H: 2014 Integrated Circuit Stress Test Identification Based on Failure Mechanism
- · CNAS-RL02 Capability Verification Rules
- · RB/T214-2017 General Requirements for Qualification Accreditation Capability Evaluation of Inspection and Testing Institutions
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