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Chuangxin Online Testing has been awarded the title of "Excellent Automotive Chip Testing Laboratory of 2025", reshaping the automotive chip testing standards with technological innovation

Date:2025-06-23 14:37:31 Views:40

On June 19-20, 2025, the 3rd Auto SEMI Intelligent Automotive Chip Industry Conference was grandly opened in Jiading, Shanghai. This conference is jointly organized by Jiangxin Automobile and Shanghai Automotive Chip Engineering Center, bringing together leading enterprises, top experts, and industry elites in the global automotive chip industry chain to explore technological innovation and industrial integration development of intelligent automotive chips.


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At this conference, Chuangxin Online Testing, with outstanding technical strength and industry contributions, successfully won the title of "Excellent Automotive Chip Testing Laboratory of 2025". This award aims to recognize outstanding enterprises and individuals who adhere to technological innovation and pursue excellent quality in the field of automotive supply chain. This honor is not only an authoritative certification of Chuangxin's professional technical capabilities in online testing, but also a high recognition of its contribution to promoting industry technological upgrading.


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This award fully demonstrates the leading position of Chuangxin Online Inspection in the field of automotive chip inspection technology. The company is reshaping industry technical standards and setting benchmarks for innovative development of the industrial chain, relying on its unique testing methods and strict quality standards. This achievement not only demonstrates the core technological competitiveness of the enterprise, but also reflects the breakthrough strength of Chinese enterprises in the key link of automotive chips, which has important demonstration significance for promoting the overall progress of the industry.


In the future, Chuangxin Online Testing will continue to delve into the dual fields of reliability verification and functional safety testing of automotive grade chips, fully promoting the localization process of intelligent automotive chips.