Date：2024-03-15 13:57:31

In the semiconductor industry, chip failure analysis is a crucial task that involves various precision technologies and methods to identify the causes of failures in integrated circuit (IC) devices, ensure product quality, and optimize production processes. The following will provide a detailed introduction to several commonly used methods for chip failure detection and their specific applications: View >>

Date：2024-03-15 13:57:24

IGBT (Insulated Gate Bipolar Transistor) is a composite fully controlled voltage driven power semiconductor device composed of BJT (bipolar transistor) and MOS (insulated gate field-effect transistor), which combines the advantages of high input impedance of MOSFET and low on/off voltage drop of GTR. The saturation voltage of GTR decreases, the current carrying density is high, but the driving current is high; MOSFET has low driving power, fast switching speed, but high conduction voltage drop and low current density. IGBT combines the advantages of the above two devices, with low driving power and reduced saturation voltage. View >>

Date：2024-03-14 11:38:31

Mechanical impact testing mainly simulates the impact effects that equipment and its components may encounter during transportation or use, and analyzes the product's ability to withstand external impact environments through transient energy exchange through shock waves. The intention of the experiment is to understand its structural weaknesses and functional degradation, which helps to understand the structural strength and appearance resistance to impact, drop, and other characteristics of the product. Effectively evaluate the reliability of products and monitor the consistency of production line products. View >>

Date：2024-03-14 11:38:25

As one of the typical applications of IGBT, three-phase inverter circuit has a wide range of application fields and huge differences. IGBT needs to withstand different speed requirements in different application scenarios, from wind turbines to automotive engines, thus facing continuous to short pulse loads. This working state generates a large amount of heat, which brings huge thermal and mechanical stress to the device. To address this issue, intelligent design, material science, and effective cooling technologies have all become key factors. View >>

Date：2024-03-13 16:21:23

Chips are an important component of modern electronic devices, and their quality and authenticity directly affect the performance and reliability of the equipment. Therefore, how to distinguish the authenticity of chips through detection is a very important issue. This article will introduce several common methods for chip authenticity detection. View >>

Date：2024-03-13 16:21:21

According to the equivalent circuit diagram of IGBT, it can be seen that if a driving positive voltage is applied between the gate G and the emitter E of IGBT, the MOSFET will conduct. This results in a low resistance state between the collector C and the base of the PNP transistor, causing the transistor to conduct; If the voltage between the gate and emitter of IGBT is 0V, the MOS is cut off, cutting off the supply of base current to the PNP transistor, causing the transistor to cut off. IGBT, like MOSFET, is also a voltage controlled device. A DC voltage of more than ten volts is applied between its gate G and emitter E, and only a leakage current at the uA level flows through, basically not consuming power. View >>

Date：2024-03-12 15:48:13

As the core component of electronic devices, the performance of integrated circuit (IC) chips directly determines the quality and reliability of the overall product. Therefore, comprehensive and meticulous testing of IC chips is crucial in production, use, and maintenance processes. The following will provide a detailed introduction to the main testing items used to test the quality of IC chips: View >>

Date：2024-03-12 15:48:01

Routine testing reports refer to reports prepared after routine testing, testing, and analysis of products, substances, or services. To ensure the quality and reliability of testing reports, routine testing reports usually need to meet the following basic requirements: View >>

Date：2024-03-11 15:50:54

With the increasing advancement and efficiency of power electronics technology, IGBT has become a popular choice for industrial applications. IGBT (Insulated Gate Bipolar Transistor) is a three terminal semiconductor device that supports high voltage and high current applications while providing fast switching speed. Like any other electronic device, IGBTs also experience performance degradation and may fail due to various factors. Therefore, it is crucial to test the good or poor condition of IGBT before using it in power electronic circuits to prevent any potential catastrophic damage to the equipment and avoid financial losses. In this article, we will discuss various methods for testing the good or bad state of IGBT. View >>

Date：2024-03-11 15:50:42

IGBT, also known as insulated gate bipolar transistor, is a power semiconductor device widely used in fields such as motor drive, power conversion, and energy management. The structure of IGBT includes P+collector, N-drift region, P-base region, and N+emitter. When a positive voltage is applied between the gate and emitter, the IGBT conducts, allowing current to flow from the collector to the emitter. View >>