Date：2024-02-28 17:26:22

With the rapid development of power electronics technology, switch mode power supplies have been widely used in various fields. During use, the switching power supply may malfunction, and short circuit is one of the more common and serious faults. This article will provide a detailed introduction to how to use scientific methods to determine whether a switching power supply is short circuited, and propose corresponding solutions to the problem of short circuits. View >>

Date：2024-02-27 17:32:19

With the rapid development of integrated circuit technology, the functional complexity and integration of chips are increasing day by day. One of the key steps to ensure the quality of chip manufacturing is to conduct detailed and comprehensive functional testing. Chip functional testing is the core process of verifying whether the chip design meets the predetermined specifications, whether the performance meets the standards, and whether it can work stably in the expected environment. The following are the main test categories and their contents included in chip functional testing: View >>

Date：2024-02-27 17:32:09

In electronic devices, chips are one of the core components, and their performance and stability directly affect the operational effectiveness of the entire system. However, during production and use, chips may be damaged due to various internal and external factors. This article will delve into some common causes of chip damage and propose corresponding prevention and solution measures. View >>

Date：2024-02-26 16:46:51

Integrated circuit (IC) chips play a core role in various electronic devices, and their performance directly affects the functionality and stability of products. When it is suspected that the IC chip may be damaged, a series of scientific and rigorous testing methods are needed to accurately determine. The following will elaborate on the main detection methods for determining whether an IC chip is damaged: View >>

Date：2024-02-26 16:46:41

The three comprehensive tests are experiments that combine temperature, humidity, and oscillation functions. The experimental conditions are achieved by combining a constant temperature and humidity experimental box or a rapid temperature rise and fall experimental box with an oscillation table, in order to assess the adaptability of the test object or evaluate its behavior. Compared with the effect of a single element, it can more accurately reflect the adaptability of electrical and electronic products to temperature, humidity, and oscillation composite environmental changes during transportation and actual use, revealing the shortcomings of the product. It is an essential experimental technique in the entire process of new product development, prototype experiments, and product qualification judgment experiments. View >>

Date：2024-02-19 16:14:56

With the popularization of modern electronic devices, chips have become an indispensable part of electronic devices. Due to the intricate manufacturing process of chips, chip damage can have a serious impact on the performance of equipment. Therefore, how to detect whether the chip is damaged has become a very important issue. View >>

Date：2024-02-02 11:14:34

In modern electronic devices, integrated circuit chips (ICs) play a crucial role. These chips contain millions of tiny electronic components, such as transistors, capacitors, and resistors, which make up circuits that enable electronic devices to operate normally. However, due to various reasons, IC chips may be damaged, causing the device to malfunction. Therefore, it is particularly important to check whether the chip is damaged. The following are several common IC chip detection methods. View >>

Date：2024-02-02 11:14:31

EMC issues mainly include two aspects: electromagnetic interference (EMI) and electromagnetic tolerance (EMS). EMI refers to the phenomenon in which electronic devices are disturbed in the normal operation of other devices due to the radiation or conduction of electromagnetic waves in an electromagnetic environment. EMS refers to the ability of electronic devices to operate normally in an electromagnetic environment without being affected by electromagnetic interference from other devices. To address EMC issues, a series of design and testing measures need to be taken. View >>

Date：2024-02-01 11:58:56

In the process of chip design and production, chip verification testing is a crucial step. It ensures that the functionality and performance of the chip meet specification requirements, and eliminates any manufacturing defects and design errors. This article will explore the key knowledge points of chip verification testing to help readers better understand and respond to the challenges of chip verification testing. View >>

Date：2024-02-01 11:58:48

X-ray detection is a very effective method that can be used to detect the virtual soldering situation of chips. Virtual soldering refers to insufficient contact between solder joints and pads, which may lead to poor electrical connections, signal interference, and other issues. In the process of chip manufacturing, virtual soldering is a common problem, so timely detection and repair are needed. View >>