Hard Core! Static parameter testing of components is so simple!

Date：2023-08-31 17:36:00 Views：366

In recent years, the automotive industry has developed rapidly

Driving the growth of demand for domestic discrete components

High voltage MOS, IGBT, etc. in automotive applications

The testing demand for components is also increasing day by day

To meet the testing needs of our customers and friends for components

Continuously providing efficient testing services to customers

Chuangxin's online testing has also introduced more advanced intelligent testing equipment

Static parameter tester for power components!

Applicable scopeStatic parameter tester for power devices

Power components are an important component of the development of electronic technology, playing a crucial role in the conversion control between strong and weak currents. They are the core devices for electronic devices to achieve power conversion and power management. Their application environment is relatively complex and variable, so the reliability requirements for devices can be said to be at the forefront of components

However, it is worth noting that there are significant differences in the performance of power devices with different materials and technologies. Many traditional testing techniques or testers can generally only cover the routine testing needs of the device, but for some special materials, high voltage, and high current tests, they can only indicate "love and help". Our company's static parameter testing technology for power components is very mature and has a wide range of testable applications, Can quickly assist customers and friends in testing whether the sample is abnormal or ineffective, and whether it can be used on the machine normally, etc

The testing application scope includes the following aspects

Test scope:

1) Voltage range: 0- ± 5000V

2) Current range: 0- ± 1600A

3) Gate level voltage range: 0- ± 100V

4) Voltage resolution: 0.1mV

5) Current resolution: 0.1nA

Testing AdvantagesStatic parameter testing of power devices

1. It can cover the testing of high-power features and ensure the testing accuracy of low-power devices

2. Support single point testing, I-V curve scanning, and curve comparison functions

3. Support the comparison of product curves for different batches of the same specification and model

4. Support product curve comparison between different manufacturers with the same specification and model

5. Can undertake open communication interfaces, connect probe stations for wafer/chip testing, and also undertake module testing with HANDLE fixtures and adapters

6. Test data can be stored as Excel files and WORD reports

Main testable parametersStatic parameter testing of power devices

Detection data

Characteristic output curve

Only through professional testing methods and techniques can the performance of the device be systematically tested to determine the quality of the device, making your procurement and production worry free.