Date：2021-12-28 14:43:00

rohs2. What are the 0 test items? At present, the version of RoHS is 2.0, and 6 tests are mandatory for products exported to the EU. Ten mandatory tests will be conducted from July 22, 2019. RoHS2. 0 is an upgraded version of the old ROHS test item. 2011 / 65 / EC Directive is changed to rohs10 items: lead (PB), cadmium (CD), mercury (Hg), hexavalent chromium (Cr6 +), polybrominated biphenyls (PBBs) and polybrominated diphenyl ethers (PBDEs), di-n-butyl phthalate (DBP), n-butyl benzyl phthalate (BBP), 2-hexyl phthalate (DEHP), hexabromocyclododecane (hbcdd). View >>

Date：2021-12-28 13:50:00

An electronic product, from the initial model prototype to the hands of consumers, an important thing related to whether the electronic product can leave the factory is to see whether the electronic product can pass the test of reliability test equipment. All products must have a certificate before they can be sold to consumers. If electronic products want to get a certificate, they must pass the test of reliability test equipment. The working principle of this reliability test equipment is to simulate the working environment of electronic products and make these electronic products work in different environments, such as high temperature and high humidity, To test the high temperature and humidity resistance of these electronic products. Through the detection of these reliability test equipment, we can know what else this type of electronic products have View >>

Date：2021-12-28 13:42:00

Not all ICs can be burned, only memory can be burned. But now many single-chip computers have integrated program memory, so single-chip computers can also burn. The principle of the burner is to change the internal 010101 structure of the chip by powering up the chip within the allowable timing range for the programmable chip, so as to achieve the expected effect. It is mainly used for programming (or brush writing) of chips such as single chip microcomputer (including embedded) / memory (including BIOS). As the core component of a product, once its internal program is stolen, the whole product will face the risk of cracking. This paper will introduce the production method of IC burning to ensure quality and safety. View >>

Date：2021-12-28 13:22:00

Reliability test can be divided into environmental test, life test, special test and field service test. The reliability test of electronic products generally includes: high and low temperature, temperature impact, transportation vibration, drop, high accelerated life test, etc. Among them, high accelerated life testing (halt test for short) is a process of revealing design defects and deficiencies by using the vibration system of rapid high and low temperature transformation for electronic and mechanical assemblies. The purpose of halt is to identify the function and failure limit of the product in the early stage of product development, so as to optimize the reliability of the product. View >>

Date：2021-12-27 14:10:00

The main failure modes of electronic components include but are not limited to open circuit, short circuit, burning, explosion, electric leakage, function failure, electrical parameter drift, unstable failure, etc. Failure may occur in all stages of the product life cycle, in all links from product development stage, production stage to use stage. By analyzing the failed products of process waste and defective products, early failure, test failure, pilot test failure and on-site failure, the failure mode and failure mechanism are clarified, and finally the failure cause is clarified. View >>

Date：2021-12-27 14:03:37

The electrical performance of electronic and electrical equipment directly affects the safe and reliable operation of the whole electrical system. In order to ensure the safety of equipment, all electronic and electrical equipment must pass various type tests in the production and manufacturing process to ensure the safety of electrical environment. The electrical performance test includes the basic parameter test of conductor or insulation quality, such as conductor resistance, insulation resistance, correct value of dielectric loss angle, capacitance, etc. The higher the working voltage of the cable, the stricter the requirements for its electrical performance. View >>

Date：2021-12-27 13:57:58

Some engineers probably have no problem burning chips in the R & D and testing stage, but once they enter mass production, the production department will frequently feed back the poor burning of chips. What is the reason? Can't the chip burning program burn in? The following mainly introduces the cause analysis of poor burning. View >>

Date：2021-12-27 13:53:06

Online burning, which integrates burning and testing, has attracted more and more attention. In order to speed up the burning efficiency, the burning tooling or fixture is often made, and the longer the wiring is required between the tooling, fixture and programmer. The longer the wiring is, the faster the signal attenuation is, and the burning defect rate also increases. This paper will introduce several measures to improve the instability of chip burning. View >>

Date：2021-12-24 11:52:00

Chip reliability test is mainly divided into two major items: environmental test and life test. The environmental test includes mechanical test (vibration test, impact test, centrifugal acceleration test, outgoing line tensile strength test and outgoing line bending test), outgoing line weldability test, temperature test (low temperature, high temperature and temperature alternating test) Damp heat test (constant humidity and alternating damp heat), special test (salt spray test, mold test, low pressure test, electrostatic resistance test, ultra-high vacuum test and nuclear radiation test); The life test includes long-term life test (long-term storage life and long-term working life) and accelerated life test (constant stress accelerated life, step stress accelerated life and sequential stress accelerated life), some of which can be done selectively. View >>

Date：2021-12-24 11:50:58

The chip is generally not broken. If it is broken, the most common is breakdown damage. You can use a multimeter to measure the resistance or voltage of the power supply end of the chip to the ground. Generally, if it is within tens of ohms or the power supply voltage is lower than the normal value, most of it can be regarded as breakdown damage. You can disconnect the power supply end and measure whether the power supply is normal. If the measured resistance is large, it is likely that other ports are damaged. You can also measure other ports one by one. See if there is a port shorted to ground. View >>