Date：2024-05-16 17:02:29

Electronic products often face the risk of damage caused by falls during manufacturing and transportation. To ensure the safety of electronic products during transportation and handling, drop testing has become one of the necessary means. This article will introduce the drop testing methods and test conditions for electronic products, to help readers understand how to correctly conduct drop testing for electronic products and ensure product quality and reliability. View >>

Date：2024-05-15 10:12:47

From the perspective of conductivity, various materials can be divided into "conductors" and "insulators", and the semiconductors we deal with every day have conductivity properties that fall between the two. For example, silicon, as an important semiconductor material, is made into various electronic components and used in electronic products. View >>

Date：2024-05-14 16:47:46

In the fields of materials science and engineering, salt spray testing is a commonly used testing method to evaluate the corrosion resistance of materials. By simulating salt spray corrosion in marine environments, salt spray testing can help engineers and researchers understand the performance of materials in harsh environments. We can accelerate the corrosion rate of the sample by increasing the concentration of chloride in the salt spray environment, which can greatly save time in obtaining results. View >>

Date：2024-05-14 16:47:00

What is component screening test? Component screening test refers to the test conducted to select products with certain characteristics or remove products with early failures. Screening test mainly refers to the test conducted to remove products with early failures. It is a non-destructive test that conducts a full inspection of a product, by applying environmental stress according to a certain procedure to stimulate potential design and manufacturing defects of the product, in order to eliminate early failed products and reduce the failure rate. View >>

Date：2024-05-13 17:18:15

With the continuous complexity of chip structures, the failure of chip products in development, production, and use has become an inevitable challenge. Failure analysis plays a crucial role in solving these problems, and X-ray testing, as a conventional and effective analytical method, plays a crucial role in failure analysis. View >>

Date：2024-05-13 17:18:11

The failure of electronic components is mostly caused by various physical and chemical changes inside and on the surface, and whether it is military or civilian products, screening is an important means to ensure reliability. This article will explore the screening testing projects for semiconductor discrete device diodes, aiming to gain a deeper understanding of the importance of these testing projects and their impact on product performance. By conducting precise screening tests, the consistency and reliability of diodes can be ensured, providing a stable foundation for the normal operation of electronic devices. View >>

Date：2024-05-11 11:43:16

What is the difference between ultrasonic scanning SAT and X-Ray? In the same laboratory, SAT and X-ray are complementary methods, and their main difference lies in displaying the characteristics of the sample. X-ray can observe the interior of the sample, mainly based on differences in material density. X-Ray is not very sensitive to stratified air, and cracks and solder joints are difficult to observe through X-Ray unless the material has sufficient physical separation. View >>

Date：2024-05-11 11:00:00

High and low temperature environmental testing is a common testing method used to evaluate the performance and reliability of products under extreme temperature conditions. This type of test can help manufacturers determine the suitability of products in extremely cold or hot environments, and identify potential issues and design defects. This article will introduce the types, effects, and placement requirements of high and low temperature environmental tests. View >>

Date：2024-05-10 13:32:22

In today's high-tech era, chips have become the core of almost all electronic devices. As the complexity of chips continues to increase, ensuring the reliability of their performance has become a key issue. Below, we will explore several important methods to ensure the reliability of chip performance. View >>

Date：2024-05-10 13:32:17

The cold and hot impact test chamber (also known as the high and low temperature impact test chamber) is a device used to test the tolerance of products. By constantly changing the temperature, it detects whether the product is damaged. The thermal and cooling effects generated will simulate climate change in various extreme scenarios. During the development phase, it can be used to detect product design and process defects, as well as for environmental stress screening, to eliminate early product failures. The severity of the test depends on factors such as high and low temperature range, residence time, temperature conversion time, and number of cycles. So what should be noted when using a high and low temperature impact test chamber? View >>