Description:

Using the Source Measurement Unit (SMU) to supply voltage or current to verify and measure the characteristics of semiconductor components (Diode I-V Curve and MOSFET Characteristic). This includes measuring parameters such as capacitance-voltage characteristics, voltage-current (IV) characteristics, resistance, capacitance, inductance values, and signal waveforms to understand the component’s faulty behavior for subsequent analysis.

Application Range:

Accurate current-voltage (IV) measurements can be performed in the range of 0.1 fA-1 A / 0.5 µV - 200 V, supporting point measurements, scan measurements, sampling, and pulse measurements.

AC capacitance measurements can be performed in the frequency range of 1 kHz to 5 MHz, supporting quasi-static capacitance-voltage (QS-CV) measurements.

Different modes can be selected, such as advanced pulse IV measurements and ultra-fast IV measurements, with a minimum sampling interval of 5 ns (200 MSa/s).

Electrical Failure Analysis (EFA) measurements.

Assisting subsequent electrical tests (Force V measure I/Force I measure V).

Image of Testing Curve:

Testing Equipment:

Keysight B1500A: Up to 4 channels, maximum voltage of 200 V, maximum current of 1A, and a power of 20W.