Description:

Decapsulation, also known as decap or delid, is a destructive experiment that removes the outer encapsulation of the chip using chemical reagents or laser etching. It is used to inspect the original manufacturer’s markings, circuit layout, process defects, etc., on the surface of the internal grains. Decapsulation is a significant means of counterfeit detection and can determine the authenticity and integrity of the chip.

Our Strengths:

We have a vast original product database, enabling quick identification of genuine and counterfeit goods. We offer various methods of decapsulation, ensuring the successful decapping of special packaging materials.

Images of Decapsulation Test:

Whole Wafer

Whole Wafer

Manufacturer’s Logo

Gallium Arsenide (GaAs)

Image of Decapsulation Testing Equipment: