Description:

Highly Accelerated Life Testing (HALT) is a process used to identify design flaws in which progressively increasing levels of accelerated environmental stress are applied to test samples. This process aims to expose weaknesses and defects in the samples, allowing for analysis and improvement of the design, manufacturing process, and materials to enhance reliability. A key characteristic of HALT is the application of stress levels that exceed the operational limits of the sample design, significantly shortening the time required to expose failures compared to normal reliability stress conditions.

Purpose: HALT is aimed to determine the operational and destruction limits of the tested object under temperature and vibration stress conditions; to provide developers with a basis for improving product design by identifying and addressing design flaws in a timely manner; to guide the selection of stress types and levels for HASS (Highly Accelerated Stress Screening).

Benefits: Rapidly identifying weaknesses in product design and manufacturing processes; Improving product design robustness; Enhancing product reliability effectively; Saving design time and costs; Troubleshooting product design issues;  Assisting in evaluating design changes.

Principle: Evaluating pass/fail criteria; Testing samples until failure occurs; Real-time monitoring of the samples during testing; Analyzing any problems discovered during the test to determine the cause of failure; Noting that the results obtained from the test cannot be used to quantify the reliability of the product.

Scope of Application :

Electrical and electronic components such as electronics, components, printed circuit boards (PCBs), and others.

Testing Items: