Description:

Beneath the Optical Microscope (OM), the prober connected to internal circuits of an IC, can be accessed to connect external devices for inputting signals or conducting electrical measurements. Based on different requirements, various equipment can be used for measurements. Electrical measurements can be conducted with a prober, providing direct and prompt information to assist failure analysis.

Scope of Application:

Electrical analysis of devices;

Study of MEMS (Micro Electro Mechanical System) and micro-structured IC;

Be applied in high-frequency circuit and FIB Probing PAD and Active Probe (200 MHz);

Probes can be employed to provide signal input and output in case sample test requiring equipment as InGaAs/OBIRCH/TLP/ESD/Curve Tracer yet without proper jig;

Wafers may subject to individual tests with this probe pad;

Our lab is equipped with a laser system for laser cutting.

Gate Voltage Scanning Curve:

Vgs vs. Ids Curve:

When fixing Vds of a transistor, Ids varies when Vgs changes, forming a “Vgs vs. Ids” curve.

This curve can be used for studying how the carriers (electrons or “electric holes”) in the channel are raised to the conducting zone. Both the critical voltage at which a channel is formed and the critical voltage of a linear zone can be measured, providing important curves for the study of transistor characteristics.