Description:

The purpose of the constant acceleration test is to determine the impact of constant acceleration on microelectronic devices. It supplements the defects in the sample’s structure and mechanical type that may not be detected during mechanical shock and vibration tests. It also serves as a high-stress test to evaluate the limits of mechanical strength of packaging, internal bonding, chip or substrate soldering, and other components. It reinforces the existing mechanical shock and vibration tests by verifying the mechanical structure limits.

The chip product is subjected to the force generated by a steady-state acceleration (except gravity) to evaluate the adaptability and performance of the structure. It also assesses the structural integrity of certain components and evaluates the electrical parameters of the test sample under steady-state acceleration conditions.

The acceleration range of this equipment is 5000(g) to 40000(g) and complies with the requirements defined in the Automotive Electronics Council (AEC) standards. For devices with less than 40 pins, 30000(g) is used, which fully meets the size range of conventional chips.

Failure modes: Physical damage, abnormal internal wire bonding.

Scope of Application:

Integrated circuits and semiconductor components, following the automotive electronics standard according to AEC.

Images of Testing Equipment:

Testing Platform

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